The ability to measure the passage of electrical current with high spatial and temporal resolution is vital for applications ranging from inspection of microscopic electronic circuits to biosensing. The ability to image such signals passively and remotely is of great importance, in order to measure without invasive disruption of the system under study or the signal itself. A recent approach to achieving this utilizes point defects in solid-state materials; in particular, nitrogen-vacancy centers in diamond. Acting as a high-density array of independent sensors, addressable opto-electronically and highly sensitive to factors including temperature and magnetic field, these are ideally suited to microscopic wide-field imaging. In this work, we demonstrate simultaneous spatially and temporally resolved recovery signals from a microscopic lithographically patterned circuit. Through application of a lock-in amplifier camera, we demonstrate micrometer-scale imaging resolution with a millimeter-scale field of view with simultaneous spatially resolved submillisecond (up to 3500 frames s-1) recovery of dc to kilohertz alternating and broadband pulsed-current electrical signals, without aliasing or undersampling. We demonstrate as examples of our method the recovery of synthetic signals replicating digital pulses in integrated circuits and signals that would be observed in a biological neuronal network in the brain.